Plasmonic nanotechnology for photothermal applications – an evaluation

• A. R. Indhu,
• L. Keerthana and
• Gnanaprakash Dharmalingam

Beilstein J. Nanotechnol. 2023, 14, 380–419, doi:10.3762/bjnano.14.33

• charges are arranged in the direction of electric field and negative charges opposite to the field, causing a polarisation. The wavelength-dependent electric field and dipole moment determine the dielectric property of the material and also the plasmon absorption (by affecting the polarizability, as was

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

• Yue Shen,
• Ying Wang,
• Yuan Zhou,
• Chunxi Hai,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

• applications. Furthermore, as a general and quantitative technique for evaluating the small differences in the dielectric properties of nanomaterials, the EFS technique will extend and facilitate its nanoscale electronic devices applications in the future. Keywords: degree of reduction; dielectric property

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

• Ying Wang,
• Yue Shen,
• Xingya Wang,
• Zhiwei Shen,
• Bin Li,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

• fuel cells [41][42]. Results and Discussion A schematic diagram indicating the working principle of dielectric property mapping based on the adhesion force in the PF-QNM mode is shown in Figure 1. A dc voltage can be applied to the AFM tip in the PF-QNM mode under ambient conditions (Figure 1a). The

• , Fadh, will increase due to sample polarization (Figure 1b), which is positively correlated to its dielectric constant. Therefore, adhesion force mapping under a biased AFM tip can be expected to characterize the local dielectric property distribution. An example of adhesion force mapping with a biased

• ). So the effect of the contact potential difference between the tip and our sample was ignored in our experiments. A comparison study of dielectric property mapping by adhesion force and SPFM was also carried out. Figure 3g shows an in situ SPFM image of Figure 3c taken with an AFM tip biased at 10 V

Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials

• Xiaoxing Ke,
• Carla Bittencourt and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158

• high-resolution electron-loss spectrometers has greatly transformed the field of plasmonics and dielectric property measurements using valence EELS (VEELS). Different from ELNES which deals with the core-loss spectrum, VEELS focuses on the low-loss part of the EELS spectrum in the range of 0–50 eV and